Hitachi EUB-525

This page covers the probes catalogued for the Hitachi EUB-525 — 22 references in total, each carrying its own failure-mode table and quoting requirements. Hitachi Aloka accounts for most of what is catalogued on this system. Types catalogued: convex, linear and endocavity. On these, lens delamination across the curved window is the failure mode we see described most often. Console revisions and connector variants differ, so send a photo of the complete probe label with the system model when you request an assessment.