SIUI Apogee 5300

The SIUI Apogee 5300 has 12 catalogued probe and guide references here — pick the one matching your probe label for its fault table. The references here are mainly SIUI. You will find convex, endocavity and phased-array designs here. lens delamination across the curved window dominates the fault picture on that type. Console revisions and connector variants differ, so send a photo of the complete probe label with the system model when you request an assessment.